-Functional stress test of electronic units
Burn-In test is a functional stress test of electronic units, where the DUT’s are being exposed to high and low temperatures in a climate chamber. The temperature ranges and test time cycles are determined by the actual application and test specifications.
One of the challenges when performing Burn-In test is to optimize the total test time in the production lines to avoid expensive “bottlenecks”.
The production cost per unit can be reduced significant by designing the interface between the DUT’s and the communication of the test system in a way that allows multiple number of DUT’s to be tested in a batch. Also the DUT palette or fixturing into the Burn-In chamber should be done quickly, and in an ergonomically smooth and safe way to the operator.
DSE have made Burn-In test solutions for customers within various industries like robotics, sensor manufacturers, Oil & Gas and more. So you never start from scratch with DSE.
A DSE turnkey test solution includes design and manufacturing of: Climate chamber, fixture, palette, Tester Rack with T&M instruments, PC and test software.
Read more about a Burn-In test solution case designed and delivered by DSE as a turnkey solution, where 48 servo computer boards are being tested in parallel as one batch, where DSE has developed a cassette solution to make the handling of the tested units smooth and quick for the operator
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